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Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale

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4 Author(s)

It is with great pleasure that we introduce this special issue on Advanced Technologies and Reliable Design for Nanotechnology Systems to the IEEE Design & Test readership. We have selected four articles to cover a wide spectrum of techniques and applications for the reliable design of nanoscale systems; the techniques aim to circumvent the high defect rates and transient errors expected in advanced nanoscale technologies. Written by outstanding researchers in the field, these articles cover experimental and speculative topics. As with all special issues, these topics only represent the techniques and methodologies available today.

Published in:

Design & Test of Computers, IEEE  (Volume:22 ,  Issue: 4 )