Cart (Loading....) | Create Account
Close category search window
 

Quantifying disturbance level of voltage sag events

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Shen, C.C. ; Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan ; Wang, A.C. ; Chang, R.F. ; Lu, C.N.

This paper presents an application of fuzzy logic technique to quantify the system voltage sag disturbance level. It describes the fuzzy sets and IF-THEN inference rules involved in a process of providing a disturbance level to a voltage sag event based on the voltage dip windows defined by the South African utility ESKOM. The sag classes in the windows are exploited in defining the fuzzy membership functions which represent different classes of voltage depression and durations. The output of the fuzzy reasoning process provides a single factor that indicates the relative disturbance level of a voltage sag event. Power quality monitoring results are used to test the proposed method and the probability density distributions of the disturbance levels are presented.

Published in:

Power Engineering Society General Meeting, 2005. IEEE

Date of Conference:

12-16 June 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.