Cart (Loading....) | Create Account
Close category search window
 

Effects of field mutual leakage reactance in rotor circuit of synchronous generator on the transient and dynamic behavior

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Nagano, S. ; Toshiba Corp., Yokohama, Japan ; Hiramatsu, D. ; Hirayama, K. ; Uemura, Y.
more authors

This paper describes the effects of field mutual leakage reactance in rotor circuit (Canay reactance) on analysis of generator transient and dynamic behavior. The authors derived a detailed equivalent circuit model for generator, and analyzed sudden short circuit out-of-phase synchronization load rejection and sudden load application phenomena of the generator by simulations using the electromagnetic transients program (ATP-EMTP). Then, they compared the obtained results with the experimental data to verify the validity of the proposed equivalent circuit. In addition to these analyses, the influence of field mutual leakage reactance on analysis of power system dynamic stability was investigated.

Published in:

Power Engineering Society General Meeting, 2005. IEEE

Date of Conference:

12-16 June 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.