By Topic

Modeling of array performance degradation including single-module failure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

A model for the performance degradation of a series-parallel array is presented, which includes single-module failure as an independent parameter. The model is checked by using data relevant to two arrays located at the ENEA Casaccia research center near Rome (Italy). By using the model, a first assessing of the influence of single-module failure on array degradation is performed. As a result, it is found that module replacement is not always necessary.

Published in:

Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE

Date of Conference:

3-7 Jan. 2005