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Experimental determination of hot-carrier energy distribution and minority carrier generation mechanism due to hot-carrier effects

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4 Author(s)
Toriumi, A. ; Toshiba Corporation, Kawasaki, Japan ; Yoshimi, M. ; Iwase, M. ; Taniguchi, K.

Photon emission due to hot-carrier effect in MOSFETs is investigated in detail. Bias dependent photon intensity and its energy spectrum provide new findings about hot-carrier state in drain avalanche region. In particular, hot-carrier energy distribution is found to be a Maxwellian. The carrier temperature is evaluated from the energy spectrum experimentally, which is shown as a function of drain voltage. Minority carrier generation mechanism due to hot-carrier effect is discussed based upon photon mediated carrier generation model.

Published in:

Electron Devices Meeting, 1985 International  (Volume:31 )

Date of Conference:

1985