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Numerical simulation of complex electron optics by the charge density method

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4 Author(s)
M. Andretta ; TEMA, ENI Group, Bologna, Italy ; A. Currado ; M. Marini ; G. Zanarini

A numerical simulation of complex electron optics, typically electrostatically focused CRT, is described. The simulation is based on a charge density method and has very limited memory requirements. It allows an accurate and interactive evaluation of the effects of the geometrical structure and applied voltages on the electron ray shape. The results are compared with a finite-differences large computer simulation and with experimental measurements on spot diameter.

Published in:

IEEE Transactions on Electron Devices  (Volume:32 ,  Issue: 5 )