In MESFET and HEMT structures as the gate length is reduced below 0.5 µm in an attempt to achieve amplification at highest possible frequencies, it is essential that the depletion depth under the gate be also reduced in order to preserve a high aspect ratio that ensures a high device voltage gain factor (gm/g0) and a reasonable value of stable power gain at high frequencies. Results based on this design approach indicate that an n-A1GaAs/GaAs HEMT structure with 0.25-µm gate length could provide stable power gain in excess of 6 dB at the unity current gain frequency of 92.4 GHz, and for an aspect ratio of ten it is difficult to reduce the gate length below 0.25 µm.
Published in:
Electron Devices, IEEE Transactions on
(Volume:32
,
Issue:
1
)
Date of Publication:
Jan 1985
- Page(s):
-
11
-
17
- ISSN :
-
0018-9383
- Digital Object Identifier :
-
10.1109/T-ED.1985.21902
- Product Type:
-
Journals & Magazines
- Date of Current Version :
-
09 August 2005
- Issue Date :
-
Jan 1985
- Sponsored by :
-
IEEE Electron Devices Society