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A submicron CMOS megabit level dynamic RAM technology using doped face trench capacitor cell

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5 Author(s)
Minegishi, K. ; Nippon Telegraph and Telephone Public Corporation, Kanagawa, Japan ; Nakajima, S. ; Miura, K. ; Harada, Katsuhiro
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Process technologies for megabit level dynamic RAMs are presented emphasizing submicron channel length MOSFET characteristics and cell size reduction. N-well CMOS composed of 0.5µm n-and 0.9µm p-channel length MOSFETs are used for peripheral circuits which operate at 3V. A Trench capacitor of which face is doped with phosphorus (Doped Face Trench Capacitor) is utilized to increase a cell capacitance and to ground the cell plate. The feasibility of these technologies for megabit level dRAM are verified by a submicron 256K dRAM fabrication.

Published in:

Electron Devices Meeting, 1983 International  (Volume:29 )

Date of Conference:

1983