Referenced Items are not available for this document.
The authors describe a system that Harris Semiconductor has developed to aid in the analysis of circuit failures and predictions of functional yeilds. This system is based on a relational database in conjunction with the application of statistical tools. The core of the system is the relational database that uses the commercially available INGRES software. The system design is reviewed along with the supporting software and hardware tools used to create a tool box for yield analysis. Given the current levels of sophistication involved in manufacturing semiconductors, the flexibility of a relational database coupled with the correct analytical and statistical tools provides a powerful system for a yield enhancement resource
Published in:
University/Government/Industry Microelectronics Symposium, 1991. Proceedings., Ninth Biennial
Date of Conference: 12-14 Jun 1991
- Page(s):
- 128 - 133
- Meeting Date :
- 12 Jun 1991-14 Jun 1991
- ISSN :
- 0749-6877
- Print ISBN:
- 0-7803-0109-9
- INSPEC Accession Number:
- 4155319
- Conference Location :
- Melbourne, FL
- Digital Object Identifier :
- 10.1109/UGIM.1991.148136
- Product Type:
- Conference Publications
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