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GaAs planar doped barriers by molecular beam epitaxy

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7 Author(s)
Malik, R.J. ; U.S. Army Electronics Technology & Devices Laboratory, Fort Monmouth, NJ, USA ; Board, K. ; Eastman, L.F. ; Wood, C.E.C.
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A new majority carrier rectifying barrier device designated as a "planar-doped barrier" (PDB) has been fabricated in GaAs by MBE. The key feature of the PDB structure is that the barrier height and degree of asymmetry in the I-V characteristics can be continuously and independently controlled. In addition, the barrier can be designed to yield a constant capacitance. Experimental I-V characteristics agree well with a thermionic emission model. This planar-doped-barrier concept offers significant advantages over Schottky barriers and may, in fact, evolve into a new generic class of barrier devices.

Published in:
Electron Devices Meeting, 1980 International  (Volume:26 )

Date of Conference: 1980

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