By Topic

A process and layout-oriented short-channel MOST model for circuit-analysis programs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Compeers, J. ; Catholic University of Leuven, Leuven, Belgium ; de Man, H.J. ; Sansen, W.

A new static model for the saturation region of short-channel MOST's is presented for use in circuit-analysis programs. In addition to the finite lateral electric field at the channel end and the presence of mobile carriers in the depletion region, it takes into account an effective surface concentration and the Gaussian character of the drain junction profile. At the beginning of the circuit analysis, a preprocessor program, which is based on this new MOST model, derives a fitmodel from the processing data. During the circuit analysis, the fitformulas are adapted to the device geometry. Finally, the model is compared with existing models and with experimental results.

Published in:

Electron Devices, IEEE Transactions on  (Volume:24 ,  Issue: 6 )