By Topic

Trends in automatic testing of electronic devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Judge, D.M. ; Giordano Associates Inc., Chesapeake, VA, USA

A review of recent trends in the automated testing of electronic devices is presented for both commercial and military operations. The spinoffs from military ATE initiatives provide new opportunities for the commercial electronics industry. Improved software development tools reduce test development time. New ASICs (application-specific integrated circuits) for automatic test applications reduce hardware costs and increase portability. Combined as part of a PC-based system, these two strategies reduce the need for more costly ATE

Published in:

Southeastcon '91., IEEE Proceedings of

Date of Conference:

7-10 Apr 1991