By Topic

Harmonic distortion in the junction field-effect transistor with field-dependent mobility

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
R. B. Fair ; Bell Telephone Laboratories, Inc., Reading, Pa.

It has been found that a harmonic analysis of the usual power-law transfer characteristic of the JFET does not yield equations which accurately predict the third-harmonic distortion products for short-gate structures. However, if field-dependent mobility in the drain-source channel is taken into consideration in the equations for the drain current, a transfer characteristic is obtained of the form 3Z_{D}(1-e^{-r})/ \Gamma ^{2} , where ZDis the normalized channel height and Γ is the field factor. Equations for the distortion products M2and M3, which are derived from this type of characteristic, accurately predict M2and M3for actual devices as a function of physical parameters. Lower limits on the values of M2and M3which can be achieved in a practical JFET are presented.

Published in:

IEEE Transactions on Electron Devices  (Volume:19 ,  Issue: 1 )