Referenced Items are not available for this document.
In the course of determining the transient thermal impedance of power thyristors, step-like shifts are often observed in the temperature-sensitive voltage characteristic used to estimate the virtual junction temperature of the device. This correspondence describes investigations which have shown that these step-like shifts are in fact spontaneous voltage transients which are highly sensitive functions of current and temperature, and which cause small hysteresis effects in the voltage-current characteristics of the device. A simple method for adjusting the temperature sensitive voltage data to correct for such shifts is described; the method yields valid transient thermal impedance determinations in far less time than could be realized without the correction method.
Published in:
Electron Devices, IEEE Transactions on
(Volume:16
,
Issue:
5
)
Date of Publication: May 1969
- Page(s):
- 497 - 500
- ISSN :
- 0018-9383
- Digital Object Identifier :
- 10.1109/T-ED.1969.16785
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 09 August 2005
- Issue Date :
- May 1969
- Sponsored by :
- IEEE Electron Devices Society
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