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Correction [to "IEEE standard test procedure for semiconductor diodes"]

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Summary form only given, as follows. Attention has been called to the incorrect Committee listing in the "IEEE Standard Test Procedure for Semiconductor Diodes," which appeared on pages 398-402 of the August, 1964, issue of these Transactions. The second paragraph of the 'ACKNOWLEDGMENT' should read as follows. "This publication was prepared by the IEEE Task Group 28.4.10 composed of: B. Jacobs, Chairman; A. Bakanowski; J. Gillette; D.R. Fewer; E.F. Platz; and the jointly functioning ...."

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Electron Devices, IEEE Transactions on  (Volume:12 ,  Issue: 10 )