Cart (Loading....) | Create Account
Close category search window

Correction [to "IEEE standard test procedure for semiconductor diodes"]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

Summary form only given, as follows. Attention has been called to the incorrect Committee listing in the "IEEE Standard Test Procedure for Semiconductor Diodes," which appeared on pages 398-402 of the August, 1964, issue of these Transactions. The second paragraph of the 'ACKNOWLEDGMENT' should read as follows. "This publication was prepared by the IEEE Task Group 28.4.10 composed of: B. Jacobs, Chairman; A. Bakanowski; J. Gillette; D.R. Fewer; E.F. Platz; and the jointly functioning ...."

Published in:

Electron Devices, IEEE Transactions on  (Volume:12 ,  Issue: 10 )

Date of Publication:

Oct. 1965

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.