Cart (Loading....) | Create Account
Close category search window
 

A sampling framework for accurate curvature estimation in discrete surfaces

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Agam, G. ; Dept. of Comput. Sci., Illinois Inst. of Technol., Chicago, IL, USA ; Xiaojing Tang

Accurate curvature estimation in discrete surfaces is an important problem with numerous applications. Curvature is an indicator of ridges and can be used in applications such as shape analysis and recognition, object segmentation, adaptive smoothing, anisotropic fairing of irregular meshes, and anisotropic texture mapping. In this paper, a new framework is proposed for accurate curvature estimation in discrete surfaces. The proposed framework is based on a local directional curve sampling of the surface where the sampling frequency can be controlled. This local model has a large number of degrees of freedoms compared with known techniques and, so, can better represent the local geometry. The proposed framework is quantitatively evaluated and compared with common techniques for surface curvature estimation. In order to perform an unbiased evaluation in which smoothing effects are factored out, we use a set of randomly generated Bezier surface patches for which the curvature values can be analytically computed. It is demonstrated that, through the establishment of sampling conditions, the error in estimations obtained by the proposed framework is smaller and that the proposed framework is less sensitive to low sampling density, sampling irregularities, and sampling noise.

Published in:

Visualization and Computer Graphics, IEEE Transactions on  (Volume:11 ,  Issue: 5 )

Date of Publication:

Sept.-Oct. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.