Cart (Loading....) | Create Account
Close category search window
 

Characterization of Zeno behavior in hybrid systems using homological methods

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ames, A.D. ; Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA ; Sastry, S.

It is possible to associate to a hybrid system a single topological space its underlying topological space. Simultaneously, every hybrid system has a graph as its indexing object its underlying graph. Here we discuss the relationship between the underlying topological space of a hybrid system, its underlying graph and Zeno behavior. When each domain is contractible and the reset maps are homotopic to the identity map, the homology of the underlying topological space is isomorphic to the homology of the underlying graph; the nonexistence of Zeno is implied when the first homology is trivial. Moreover, the first homology is trivial when the space of the incidence matrix is trivial. The result is an easy way to verify the nonexistence of Zeno behavior.

Published in:

American Control Conference, 2005. Proceedings of the 2005

Date of Conference:

8-10 June 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.