Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Optical tomography imaging based on higher order Born approximation of diffuse photon density waves

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Scherleitner, E. ; Inst. of Meas. Technol., Johannes Kepler Univ. of Linz, Austria ; Zagar, B.G.

In this paper, we introduce a tomographical system suitable for imaging absorbers in strongly scattering media using a single light source-detector pair. Their reflective alignment would make it possible to implement both source and detector into a compact scan-head. Suitable probes would be soft tissue, some strongly scattering biological probes, or translucent technical materials, for example. An intensity-modulation technique is utilized to take advantage of the amplitude and delay alterations between the source and the detector. The propagation of the photons is modeled by the Helmholtz equation and then appropriate inverse calculations of several measurements reveal the distribution of the absorption coefficient inside the investigated volume. Therefore a reconstruction algorithm employing a Born approximation of higher order and a Tikhonov-regularization scheme were used to solve the deduced ill-posed and underdetermined system of equations. In this paper, we present results of simulations as well as of measurements.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:54 ,  Issue: 4 )