Cart (Loading....) | Create Account
Close category search window
 

Image residue approach for masked targets detection and estimation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chieh-Fu Chang ; Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Bell, M.R.

We propose a new approach to the detection of masked targets and the estimation of target parameters with significant computational savings over standard approaches to this problem based on the CLEAN algorithm. In particular, our approach implements the CLEAN process efficiently because only a few select samples are used instead of using all samples from the matched filter output. For situations in which the signal amplitude and phase need to be estimated, we propose a modified data model for the algorithm so that these parameters and the image residues can be estimated simultaneously. We also provide a detection algorithm having a quantitative way for selecting detection samples and residue samples such that the detection performance is optimized.

Published in:

Signal Processing, IEEE Transactions on  (Volume:53 ,  Issue: 8 )

Date of Publication:

Aug. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.