Cart (Loading....) | Create Account
Close category search window
 

Calculation of microwave land surface emissivity from satellite observations: validity of the specular approximation over snow-free surfaces?

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Karbou, F. ; Centre Nat. de Recherches Meteorologiques, CNRM, Toulouse, France ; Prigent, C.

To determine land surface emissivity from satellite microwave measurements, the surface is usually assumed to be specular. Questions about the validity of this approximation to estimate emissivity from nadir viewing radiometers were raised. This work aims to examine the validity of the specular assumption by evaluating errors induced when deriving emissivities from near-nadir measurements over snow-free areas. Brightness temperature simulations near nadir above both a specular and a Lambertian surface are compared. Errors on the retrieved emissivity introduced by the specular assumption are also quantified. The results show that the impact of the specular assumption when the surface is Lambertian is limited: less than 1% error in most atmospheric situations over natural snow-free surfaces.

Published in:

Geoscience and Remote Sensing Letters, IEEE  (Volume:2 ,  Issue: 3 )

Date of Publication:

July 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.