Close category search window
 

H-RAFT - heuristic reachability analysis for fault tolerance protocols modelled in SDL

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Bohm, S.M. ; Duisburg Univ., Essen, Germany

Design flaws of fault tolerance techniques may lead to undesired consequences in particular fault cases under very special operating conditions. Such rare "fault tolerance holes" may be very difficult to reveal. This paper presents a novel approach directing the analysis towards potential weaknesses in a fault tolerance technique. A new algorithm based on special heuristics performs partial reachability analysis of SDL models describing fault-tolerant communication. It aims at finding violations of fault tolerance properties in an efficient way. The approach does not require knowledge of the model under investigation. The new algorithm is evaluated by experiments with realistic protocols - including a large model of an industrial system - and compared to the performance of known solutions.

Published in:
Dependable Systems and Networks, 2005. DSN 2005. Proceedings. International Conference on

Date of Conference: 28 June-1 July 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.