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Discriminative learning of Markov random fields for segmentation of 3D scan data

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7 Author(s)
Anguelov, D. ; Dept. of Comput. Sci., Stanford Univ., CA, USA ; Taskarf, B. ; Chatalbashev, V. ; Koller, D.
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We address the problem of segmenting 3D scan data into objects or object classes. Our segmentation framework is based on a subclass of Markov random fields (MRFs) which support efficient graph-cut inference. The MRF models incorporate a large set of diverse features and enforce the preference that adjacent scan points have the same classification label. We use a recently proposed maximum-margin framework to discriminatively train the model from a set of labeled scans; as a result we automatically learn the relative importance of the features for the segmentation task. Performing graph-cut inference in the trained MRF can then be used to segment new scenes very efficiently. We test our approach on three large-scale datasets produced by different kinds of 3D sensors, showing its applicability to both outdoor and indoor environments containing diverse objects.

Published in:
Computer Vision and Pattern Recognition, 2005. CVPR 2005. IEEE Computer Society Conference on  (Volume:2 )

Date of Conference: 20-25 June 2005

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