By Topic

Probabilistic diagnosis algorithms tailored to system topology

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
S. Rangarajan ; Maryland Univ., College Park, MD, USA ; D. Fussell

The authors previously (1989) presented algorithms in which if at least two processors perform tests on any given processor, the probability of correct diagnosis approaches one as N to infinity if the number of tests performed by each tester on each processor under test is O(log N). The algorithm was based on a comparison approach to probabilistic system-level fault diagnosis in which processors may perform multiple tests on other processors. Here they present a new hierarchical testing algorithm for this model and show that asymptotically efficient testing can be done when the product of number of testers*number of tests each performs on a processor grows as O(log N) as N to infinity . The method thus preserves the topological flexibility of the previous method, while allowing the number of tests each tester must perform to be tailored to the requirements of the topology.<>

Published in:

Fault-Tolerant Computing, 1991. FTCS-21. Digest of Papers., Twenty-First International Symposium

Date of Conference:

25-27 June 1991