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A test strategy for time-to-digital converters using dynamic element matching and dithering

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5 Author(s)
Wenbo Liu ; Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA ; Hanqing Xing ; Le Jin ; Geiger, R.
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This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic element matching and dithering to generate linear time interval excitations for precision TDC test. Transition time points of a TDC can be measured with picosecond accuracy by using the proposed strategy, which enables the test and calibration of TDCs used in jitter characterization of communications systems with multigigabit-per-second data rates.

Published in:

Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on

Date of Conference:

23-26 May 2005