By Topic

A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hanjun Jiang ; Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA ; Olleta, B. ; Degang Chen ; Geiger, R.L.

Dynamic element matching (DEM) is an effective way to achieve good average performance in the presence of device mismatch, yet it has not been widely adopted because of the time-local stationarity of the signal path. This paper presents a DEM approach to ADC testing in which low precision DEM DACs are used to generate stimulus signals for the ADCs under test. A deterministic DEM (DDEM) switching scheme is applied to a segmented thermometer coded DAC architecture. Detailed simulation results are presented to verify the expected performance of the proposed testing approach. The new approach is able to accurately test ADCs with linearity that exceeds that of the original DAC used as the signal generator. The new architecture is suitable for production test and built-in-self-test (BIST) environments where high linearity ADCs are difficult to test and characterize.

Published in:

Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on

Date of Conference:

23-26 May 2005