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Tunnel magnetoresistance in magnetic tunnel junctions with a disordered Co2(Cr1-xFex)Al full-Heusler alloy film

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5 Author(s)
S. Okamura ; Dept. of Mater. Sci., Tohoku Univ., Sendai, Japan ; A. Miyazaki ; N. Tezuka ; S. Sugimoto
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The structural properties of Co2(Cr1-xFex)Al annealed at various temperatures and prepared on heated substrates are demonstrated. The TMR properties of MTJs with the disordered Co2(Cr1-xFex)Al is also shown. Magnetoresistance measurement of the MTJs was performed by using a four-point probe technique. Film structures and oxidization at surfaces and interfaces were characterized by using X-ray diffraction (XRD) (Cu-Kα) and X-ray photoelectron spectroscopy (XPS) (Al-Kα), respectively.

Published in:

INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.

Date of Conference:

4-8 April 2005