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XPS and XMCD study of Fe3O4/GaAs interface

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6 Author(s)
Lu, Y.X. ; Spintronics Laboratory, York Univ., UK ; Claydon, J.S. ; Ahmad, E. ; Xu, Y.B.
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Surface and interface of Fe oxide/GaAs(100) hybrid structure were characterized using X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (XAS) and X-ray magnetic circular dichroism (XMCD). Series of samples were prepared by post-growth oxidation. The thickness dependences of the interface magnetic properties and chemical composition were also investigated.

Published in:

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Date of Conference:

4-8 April 2005

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