XPS and XMCD study of Fe/sub 3/O/sub 4//GaAs interface

Surface and interface of Fe oxide/GaAs(100) hybrid structure were characterized using X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (XAS) and X-ray magnetic circular dichroism (XMCD). Series of samples were prepared by post-growth oxidation. The thickness dependences of the interface magnetic properties and chemical composition were also investigated.