Cart (Loading....) | Create Account
Close category search window
 

A new electronic set up for pulse shape method with large area planar silicon detector of CHIMERA

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

41 Author(s)
Alderighi, M. ; Ist. Nazionale di Fisica Nucl., Italy ; Amorini, F. ; Anzalone, A. ; Arena, N.
more authors

In any of the modern 4π particle detector array improvements of the measured parameters have been envisaged. Pulse shape discrimination (PSD) is an efficient electronic tool which can be applied to a single detector to achieve atomic number Z separation of the particles comparable to the ΔE - E telescopes. In the present study, a simple PSD device based on commercially available modules has been discussed with the motivation of future improvement in CHIMERA detector system without sacrificing time resolution in time of flight (TOF) measurement. In beam studies of PSD have been carried out following the ejected particles from 19F + 12C reaction at tandem energies with 2 large area - 300 μm - silicon detectors of CHIMERA multi-detector. Front-side and rear-side entry of the detected ions were explored. Performance of the PSD set up has been discussed.

Published in:

Nuclear Science Symposium Conference Record, 2004 IEEE  (Volume:3 )

Date of Conference:

16-22 Oct. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.