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Measurement of photonic mode dispersion and linewidths in silicon-on-insulator photonic crystal slabs

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11 Author(s)
Galli, M. ; Dipt. di Fisica "A. Volta", Univ. degli Studi di Pavia, Italy ; Bajoni, D. ; Belotti, M. ; Paleari, F.
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The dispersion of photonic modes in one-dimensional (1-D) and two-dimensional (2-D) patterned silicon-on-insulator (SOI) waveguides, also containing line defects, is fully investigated both above and below the light line. Quasi-guided (radiative), as well as truly guided modes are probed by means of angle- and polarization-resolved microreflectance and attenuated total reflectance measurements. For the 1-D case, the sharp resonances observed in reflectance spectra are analyzed in terms of the Airy-Fano model, and the measured linewidths are shown to be very close to theoretical predictions. In the 2-D lattices containing W1 line defects the presence of a supercell repetition leads to the simultaneous excitation of defect and bulk modes which are folded in a reduced Brillouin zone. The measured dispersion is in very good agreement with full three-dimensional calculations based on expansion on the waveguide modes, indicating that a deep understanding of the propagation properties of patterned SOI waveguides is achieved.

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Selected Areas in Communications, IEEE Journal on  (Volume:23 ,  Issue: 7 )