Close category search window
 

Capacity-achieving ensembles for the binary erasure channel with bounded complexity

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Pfister, H.D. ; Qualcomm Inc., San Diego, CA, USA ; Sason, I. ; Urbanke, R.

We present two sequences of ensembles of nonsystematic irregular repeat-accumulate (IRA) codes which asymptotically (as their block length tends to infinity) achieve capacity on the binary erasure channel (BEC) with bounded complexity per information bit. This is in contrast to all previous constructions of capacity-achieving sequences of ensembles whose complexity grows at least like the log of the inverse of the gap (in rate) to capacity. The new bounded complexity result is achieved by puncturing bits, and allowing in this way a sufficient number of state nodes in the Tanner graph representing the codes. We derive an information-theoretic lower bound on the decoding complexity of randomly punctured codes on graphs. The bound holds for every memoryless binary-input output-symmetric (MBIOS) channel and is refined for the binary erasure channel.

Published in:
Information Theory, IEEE Transactions on  (Volume:51 ,  Issue: 7 )

Date of Publication: July 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.