Cart (Loading....) | Create Account
Close category search window
 

Morton (Z) scan based real-time variable resolution CMOS image sensor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Artyomov, E. ; VLSI Syst. Center, Ben-Gurion Univ., Beer-Sheva, Israel ; Rivenson, Y. ; Levi, G. ; Yadid-Pecht, O.

An image sensor architecture with an alternative image scan method, based on Morton (Z) order, is presented. This scan, compared to the conventional row scan, enables faster and efficient average computation of square image blocks. Digital averaging is used and the pixel data is read out with either the original resolution, a 2 × 2 or a 4 × 4 block averaging. A test chip of 128 × 128 array has been implemented in 0.35-μm CMOS technology, has 15% fill factor, is operated by a 3.3-V supply and dissipates 30 mW at video rate.

Published in:

Circuits and Systems for Video Technology, IEEE Transactions on  (Volume:15 ,  Issue: 7 )

Date of Publication:

July 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.