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Browse Journals & Magazines > Proceedings of the IEEE ...> Volume:74 Issue:5 Help

A decorrelation-based Monte Carlo simulation—Its application to yield statistics of charge-redistribution A/D converters

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3 Author(s)
Lee, Y.T. ; Samsung Semiconductor and Telecommunications Inc., Suwon, Korea ; Kyung, C.M. ; Kim, C.K.

A Monte Carlo method for yield estimation in charge-redistribution A/D converters is described, where the capacitances are random variables with finite correlation among themselves. The symmetric property of the resultant covariance matrix was exploited to decorrelate the random variables into another set of independent random variables.

Published in:
Proceedings of the IEEE  (Volume:74 ,  Issue: 5 )

Date of Publication: May 1986

Page(s):
749 - 751
ISSN :
0018-9219
Digital Object Identifier :
10.1109/PROC.1986.13538
Product Type:
Journals & Magazines
Date of Current Version :
28 June 2005
Issue Date :
May 1986
Sponsored by :
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