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A decorrelation-based Monte Carlo simulation—Its application to yield statistics of charge-redistribution A/D converters

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3 Author(s)
Lee, Y.T. ; Samsung Semiconductor and Telecommunications Inc., Suwon, Korea ; Kyung, C.M. ; Kim, C.K.

A Monte Carlo method for yield estimation in charge-redistribution A/D converters is described, where the capacitances are random variables with finite correlation among themselves. The symmetric property of the resultant covariance matrix was exploited to decorrelate the random variables into another set of independent random variables.

Published in:

Proceedings of the IEEE  (Volume:74 ,  Issue: 5 )