Cart (Loading....) | Create Account
Close category search window
 

In-situ testability design (ISTD)—A new approach for testing high-speed LSI/VLSI logic

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Tsui, F.F. ; IBM Thomas J. Watson Research Center, Yorktown Heights, NY

After a discussion of the main problems encountered in conventional methods used for testing high-speed LSI/VLSI logic, a new approach, to be called the "in-situ testability design" (ISTD), will be presented. The approach consists of extending the use of latches and serial-shift arrangements (SSA's) provided in the hardware system to be tested, by incorporating on-chip feedback arrangements designed in such a way that the chips and modules will be self-sufficient for testability-that they will be testable in-situ and in-isolation, despite their interconnections after being assembled in the system. By proper design, chips can be made testable also on-wafer prior to their dicing. For economical implementation, arrangements for sharing the use of latches and multiplexors will be introduced and explained. The ISTD approach will fundamentally simplify and facilitate the testing of high-speed LSI/VLSI logic and greatly reduce the costs of test equipment and testing. Design procedure for its implementation, and test strategy based on its use, will be described.

Published in:

Proceedings of the IEEE  (Volume:70 ,  Issue: 1 )

Date of Publication:

Jan. 1982

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.