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Group delay ripple resulting from multiple reflections in SAW devices

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2 Author(s)
Hurlburt, D.H. ; RCA Research, Ste. Anne de Bellevue, Quebec, Canada ; Adler, E.L.

A simple formula is derived for the spurious fractional group delay ripple in the passband of systems with delay. This same formula also gives the spurious amplitude ripple in the passband. These spurious ripples are due to multiple reflections in the system, and it is shown that the fractional peak-to-peak ripple is a function of only the round-trip reflection loss or triple-transit ratio.

Published in:

Proceedings of the IEEE  (Volume:65 ,  Issue: 1 )