Cart (Loading....) | Create Account
Close category search window
 

Integrated process control for highly parallel and contact-free micro array printing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Niekrawietz, R. ; Lab. for MEMS Applications, Freiburg Univ., Germany ; Honstein, W. ; Gutmann, O. ; de Heij, B.
more authors

This paper reports for the first time on an integrated process control of a highly parallel non-contact dispenser for microarray production. Monitoring the fundamental process parameters has become indispensable because of significantly increased demands on high quality microarrays. We integrated a pressure sensor in our pneumatically actuated dispenser to acquire the transient pressure pulse during droplet ejection. This enables the total process control for the dispenser and with it the adoption of operation parameters for varying liquid properties, like viscosity, surface tension and density. We optimised pressure parameter and the geometry of the actuation chamber. This made it possible to dispense liquid viscosities up to 10.8 mPas (four fold improvement) at frequencies up to 30 Hz (15 fold improvement) for all tested liquids. In addition, the integrated pressure sensor allows to detect failure modes, like flooded actuation chamber or empty printhead nozzles, leading to a higher quality of the fabricated microarrays.

Published in:

Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on

Date of Conference:

30 Jan.-3 Feb. 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.