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Longitudinal-strain coefficient of resistivity of thin silver film

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1 Author(s)
Singh, A. ; CEERI, Rajasthan, India

The grain-boundary model proposed by Mayadas et al. has been used to calculate the longitudinal-strain coefficient of resistivity of continuous polycrystalline silver film, with a thickness greater than the intrinsic mean free path, in terms of grain-size diameter. It has been found that the longitudinal-strain coefficient of resistivity increases with grain size, and its range is from zero to bulk value as the grain size goes from zero to very large value.

Published in:

Proceedings of the IEEE  (Volume:62 ,  Issue: 4 )