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Thermally induced FM noise in Gunn oscillators and jitter in Gunn-effect digital devices

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3 Author(s)
Tanimoto, M. ; University of Tokyo, Tokyo, Japan ; Yanai, H. ; Sugeta, T.

By considering the fluctuation of the starting time of domain formation and that of domain formation time, an expression for thermally induced FM noise in Gunn oscillators is derived. The result is in good agreement with experimental data. These results are applied to estimate thermally induced jitter in Gunn-effect digital devices.

Published in:

Proceedings of the IEEE  (Volume:61 ,  Issue: 8 )