By Topic

A method of locating defective elements in large phased arrays

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)

A method of locating defective elements in any planar array is described. The method consists of sampling the near radiated field over a plane parallel to the array and reconstructing the aperture field by applying an inverse diffraction transformation. Comparison with the known correct aperture field locates the defective elements. Some numerical results are presented.

Published in:

Proceedings of the IEEE  (Volume:59 ,  Issue: 6 )