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Determination of the current distribution in power transistors by use of infrared techniques

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1 Author(s)

Although the current density distribution under an emitter finger has been theoretically determined by many authors, the calculations have never been experimentally verified. This letter presents a method of verification by comparing the surface temperature distributions predicted by those current distributions to those measured by an infrared radiometric microscope.

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Proceedings of the IEEE  (Volume:55 ,  Issue: 8 )