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Browse Journals & Magazines > Proceedings of the IEEE ...> Volume:55 Issue:8 Help

Determination of the current distribution in power transistors by use of infrared techniques

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1 Author(s)
Boncuk, R.J.

Although the current density distribution under an emitter finger has been theoretically determined by many authors, the calculations have never been experimentally verified. This letter presents a method of verification by comparing the surface temperature distributions predicted by those current distributions to those measured by an infrared radiometric microscope.

Published in:
Proceedings of the IEEE  (Volume:55 ,  Issue: 8 )

Date of Publication: Aug. 1967

Page(s):
1486 - 1487
ISSN :
0018-9219
Digital Object Identifier :
10.1109/PROC.1967.5855
Product Type:
Journals & Magazines
Date of Current Version :
28 June 2005
Issue Date :
Aug. 1967
Sponsored by :
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