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M-ary sequential hypothesis tests for automatic target recognition

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2 Author(s)
Jouny, I. ; Dept. of Electr. Eng., Lafayette Coll., Easton, PA, USA ; Garber, E.D.

Several forms of sequential hypothesis testing algorithms are described and their performance as classification algorithms for automatic target recognition is evaluated and compared. Several forms of parameteric algorithms, as well as a sequential form of a useful nonparametric algorithm are considered. The primary focus is the design of algorithms for automatic target recognition that produce maximally reliable decisions while requiring, on the average, a minimum number of backscatter measurements. The tradeoffs between the average number of required measurements and the error performance of the resulting algorithms are compared by means of Monte-Carlo simulation studies

Published in:

Aerospace and Electronic Systems, IEEE Transactions on  (Volume:28 ,  Issue: 2 )

Date of Publication:

Apr 1992

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