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An efficient random jitter measurement technique using fast comparator sampling

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4 Author(s)
Dongwoo Hong ; California Univ., Santa Barbara, CA, USA ; Dryden, C. ; Saksena, G. ; Panis, M.

This paper describes a random jitter measurement technique using simple algorithms and comparator sampling. The approach facilitates using automated test equipment (ATE) to validate devices with multiple, high-speed serial interfaces. The approach combines partial measurements based on individual data edge regions, in contrast to more common approaches that effectively first accumulate data from multiple edge regions. Random jitter is measured accurately even in the presence of deterministic and low-frequency periodic jitter, up to a cutoff frequency.

Published in:

VLSI Test Symposium, 2005. Proceedings. 23rd IEEE

Date of Conference:

1-5 May 2005

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