Cart (Loading....) | Create Account
Close category search window
 

Efficient modeling methodology and hardware validation of glass-ceramic based wiring for high-performance single- and multi-chip modules

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

13 Author(s)
Sungjun Chun ; IBM Syst. & Technol. Group, Austin, TX, USA ; Haridass, A. ; Deutsch, A. ; Rubin, B.
more authors

Ceramic-based wiring has been used in IBM in high-performance multi-chip module (MCM) carriers since the early 1980s. These types of carriers can provide very high wiring and power densities. Conductors are generally screened on individual ceramic sheets that are laminated and sintered at greater than 900° C. The high temperature process requires the use of copper paste metallization with higher resistivity than bulk copper and the punched-via fabrication imposes the use of meshed ground planes. Typical MCMs can have close to 100 layers [George Katopis (1998)] with 200-400 μm via pitch. In the case of single-chip modules (SCM), hundreds of signal I/O's on 100-200 μrn pitch redistribute to the coarser module wiring. The fan-out, the hollow shielding, and the sparse and long vias generate large signal distortion and crosstalk between signal layers and via columns. This paper describes the modeling and measurement of representative glass-ceramic based wiring for both SCM and MCM applications.

Published in:

Electronic Components and Technology Conference, 2005. Proceedings. 55th

Date of Conference:

31 May-3 June 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.