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A numerical analysis of current-voltage (I-V) characteristics of silver sheathed (Bi,Pb)2Sr2Ca2Cu3O10+δ tapes is carried out to investigate their correlation with microscopic inhomogeneities based on Weak Link Path Model. The dependence of I-V curves is calculated on the various local distributions of critical currents. Furthermore, by assuming a relationship between local distribution and temperature T, T dependence of I-V curves is examined. As a result, n value and critical current dependence on the shape of local distribution is obtained. Moreover, it is revealed that T dependent I-V characteristics show critical scaling behavior like glass-liquid transition of vortex phase as a percolation transition of non-SC links.