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A 10 gigabit-per-second data collection system for analog to digital converters

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4 Author(s)
Lavoie, C. ; Northrop Grumman Electron. Syst., Baltimore, MD, USA ; Przybysz, A.J. ; Pesetski, A.A. ; Miller, D.L.

A high speed data collection system is designed and built to allow testing of digital devices running at 10 gigabits per second. The system uses commercially available parts and consists of a signal-conditioning front end, a 1-to-16-channel data demultiplexer, an interface board, a 16-channel logic analyzer, and a personal computer. We report on the design and performance of the interface board, and the performance of the complete system whose bit-error rate was found to be 1×10-7.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:15 ,  Issue: 2 )