By Topic

A test controller board for TSS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kornegay, K.T. ; Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA ; Brodersen, R.W.

The design of a test controller board for a test support system is presented in this paper. Driven by the SCANTEST software, the test controller board exercises the boundary-scan and scan-path and built-in-self-test hardware implemented on the device under test via a dedicated test-bus. An analog test feature is also described

Published in:

VLSI, 1991. Proceedings., First Great Lakes Symposium on

Date of Conference:

1-2 Mar 1991