IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > AUTOTESTCON 2004. Proceedings ... Help

Automated measuring system designed to calibrate measuring devices using Virtual Standards® technology

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Dulev, V. ; Virtual Stand. Inc., Moscow, Russia ; Ermishin, S. ; Khoteev, N. ; Lopatin, A.
more authors

An automated measuring system is proposed to calibrate measuring devices designed to perform a wide range of measurements using the Virtual Standards® technology. The Virtual Standards® technology is a universal technology for determining and introducing corrections in measuring device readings to reduce their errors. Theoretical principles underlying the Virtual Standards® technology are discussed, and their operation flow chart and some experimental findings are provided.

Published in:
AUTOTESTCON 2004. Proceedings

Date of Conference: 20-23 Sept. 2004

Page(s):
158 - 164
ISSN :
1088-7725
Print ISBN:
0-7803-8449-0
INSPEC Accession Number:
8520908
Digital Object Identifier :
10.1109/AUTEST.2004.1436812

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.