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Identify unrepairability to speed-up spare allocation for repairing memories

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3 Author(s)
Hsing-Chung Liang ; Dept. of Electron. Eng., Chang Gung Univ., Tao-Yuan, Taiwan ; Wen-Chin Ho ; Ming-Chieh Cheng

In this paper, we discuss some strategies for identifying unrepairable memories, and from that to introduce a novel theorem that can make more precise identification. A new algorithm for searching repair solutions is also proposed, which characterizes the rows, and columns of defective memory cells with revised effective coefficients. We have simulated it on many generated example maps, and compared it with the previous algorithms to verify its efficiency. It's combined with those arranged strategies of judging unrepairability to generate a complete flow. The complete algorithm has also been run on many examples with various memory sizes, defect numbers, and distribution types. The simulation results further show that identifying unrepairability in advance can help the reconfiguration procedure run much faster than searching solutions directly.

Published in:

IEEE Transactions on Reliability  (Volume:54 ,  Issue: 2 )