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Measuring electronic transport in a single carbon nanotube inside the SEM

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6 Author(s)
Chen, Q. ; Dept. of Electron., Peking Univ., Beijing, China ; Wang, S. ; Liang, X.-L. ; Gao, S.
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Direct measurements on the electronic transport in a single carbon nanotube (CNT) were carried out inside the scanning electron microscope (SEM) using a nanoprobes system. Good contacts have been established between the probing nanotip and the CNT, and field effect on the current-voltage (I-V) curves has been demonstrated using a nanoprobe as a gate. Our results show that by using a nanoprobes system it is possible to perform reliably the electronic transport measurements on nanostructures of various shape and composition that are visible in the SEM.

Published in:
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on  (Volume:1 )

Date of Conference: 18-21 Oct. 2004

Page(s):
640 - 643 vol.1
Print ISBN:
0-7803-8511-X
INSPEC Accession Number:
8435730
Digital Object Identifier :
10.1109/ICSICT.2004.1435086
Product Type:
Conference Publications

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