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Direct measurements on the electronic transport in a single carbon nanotube (CNT) were carried out inside the scanning electron microscope (SEM) using a nanoprobes system. Good contacts have been established between the probing nanotip and the CNT, and field effect on the current-voltage (I-V) curves has been demonstrated using a nanoprobe as a gate. Our results show that by using a nanoprobes system it is possible to perform reliably the electronic transport measurements on nanostructures of various shape and composition that are visible in the SEM.
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on (Volume:1 )
Date of Conference: 18-21 Oct. 2004