Cart (Loading....) | Create Account
Close category search window
 

A ffigh efficiency FRAM design technique with non-driven plate scheme

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Yeonbae Chung ; School of Electronic and Electrical Engineering, Kyungpook National University, Daegu, Korea ; Sang-Hoon Jung ; Hyun-wook Park ; Jae-Eun Yoon
more authors

This paper proposes a new FRAM design style based on grounded-plate PMOS-gate (GPPG) cell architecture. A GPPG cell consists of a PMOS access transistor and a ferroelectric capacitor. Its plate is grounded. The proposed scheme employs three novel operating methods: 1) VDD precharged bitline, 2) negative-voltage wordline technique and 3) negative-pulse restore. Because this configuration doesn't need the on-pitch plate control circuitry, it is effective in realizing cost-effective chip sizes. Implementation for an experimental 2.5-V, 2-Mb FRAM prototype design in a 0.5-μm technology shows a cell array efficiency of 57 %, an access time of 85 ns and an active current of 12 mA, respectively.

Published in:

Electrical and Electronics Engineering, 2004. (ICEEE). 1st International Conference on

Date of Conference:

8-10 Sept. 2004

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.